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2006
7. Yang-Kyu Choi, Kuk-Hwan Kim, Jin-Woo Han, Seong-Wan Ryu, and Hyunjin Lee, "Extremely Scaled 3-Dimensional Multiple Gate Technologies for Terabit Era," Proceedings of 2006 International Conference on Nano Science and Nano Technology, p. 15, Gwangju, Korea, Dec.7-8, 2006 [PDF]

6. Seong-Wan Ryu, Chan Bin Mo, Soon Hyung Hong and Yang-Kyu Choi, "Nonvolatile Memory Characteristics of NMOSFET with Silver Nanocrystals Synthesized by Thermal Decomposition Process," Proceedings of IEEE Nanotechnology Materials and Devices Conference 2006, pp. 515-519, Gyeongju, Korea, Oct.22-25, 2006 [PDF]

5. Jin-Woo Han, Choong-Ho Lee, Donggun Park, and Yang-Kyu Choi, "Body Effects in Tri-Gate Bulk FinFETs for DTMOS," Proceedings of IEEE Nanotechnology Materials and Devices Conference 2006, pp. 208-209, Gyeongju, Korea, Oct. 22-25, 2006 [PDF]

4. Yang-Kyu Choi, Jin-Woo Han, and Hyunjin Lee, "Reliability Issues in Multi-Gate FinFETs," Proceedings of 9th International Conference on Solid-State and Integrated-Circuit Technology, pp. 1101-1104, Shanghai, China, Oct. 23-26, 2006 [PDF]

3. Kuk-Hwan Kim, Jin-Woo Han, Yang-Kyu Choi, "Investigation of Gate Misalignment Effects in FinFETs," Proceedings of 14th Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices (AWAD), pp. 179-184, Sendai, Japan, Jul. 3-5, 2006 [PDF]

2. Hyunjin Lee, Lee-Eun Yu, Seong-Wan Ryu, Jin-Woo Han, Kanghoon Jeon, Dong-Yoon Jang, Kuk-Hwan Kim, Jiye Lee, Ju-Hyun Kim, Sang Cheol Jeon, Gi Seong Lee, Jae Sub Oh, Yun Chang Park, Woo Ho Bae, Hee Mok Lee, Jun Mo Yang, Jung Jae Yoo, Sang Ik Kim and Yang-Kyu Choi, "Sub-5nm All-Around Gate FinFET for Ultimate Scaling," 2006 IEEE Symposium on VLSI Technology Digest of Technical Papaers, pp. 70-71, Hawaii USA, Jun. 13-15 2006 [PDF]

1. Hyunjin Lee, Choong-Ho Lee, Donggun Park, and Yang-Kyu Choi, "Dynamic Negative Bias Temperature Instability Characteristics and Comprehensive Modeling in PMOS Body-Tied FinFET" Proceedings of 44th IEEE International Reliability Physics Symposium , pp. 725-726, San Jose, California, USA, Mar. 26-30, 2006 [PDF]