Go To Mainpage



All | 2017 | 2016 | 2015 | 2014 | 2013 | 2012 | 2011 | 2010 | 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999
 
2000
2. C. Yun, D. Park, Y.-K. Choi, and N. Cheung, "Gate oxide damage from high dose implantation of hydrogen," Proceedings of the 13th International Conference on Ion Implantation Technology, Alpbach, Austria, Sept. 17-22, 2000. [PDF]

1. Yang-Kyu Choi, Yoo-Chan Jeon, Pushkar Ranade, Hideki Takeuchi, Tsu-Jae King, Jeffrey Bokor, and Chenming Hu, "30nm Ultra-thin-body SOI MOSFET with selectively deposited Ge raised S/D," 58th IEEE Device Research Conference Proceedings, pp. 23-24, Denver, USA, Jun. 19-21, 2000. [PDF]