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2017
2. Ik Kyeong Jin¢Ó, Hagyoul Bae¢Ó, Jun-Young Park, Choong-Ki Kim, Il-Woong Tcho, Seong-Yeon Kim, Do-Hyun Kim, Yun-Ik Son, Jae-Hoon Lee, Yong-Taik Kim, Seong-Wan Ryu, and Yang-Kyu Choi* "A Study of Radiation Immunity and Damage Recovery in SiGe pMOSFET", The 25th Korean Conference on Semiconductors(KCS), Gangwon, Korea, Feb, 5~7, 2018. ¢ÓThese authors equally contributed to this work. [PDF]

1. Joon-Kyu Han, Jun-Young Park, and Yang-Kyu Choi "Investigation of Electrothermal Annealing to Repair the Hot-Carrier Degradation in a Tri-Gate FinFET", The 25th Korean Conference on Semiconductors(KCS), Gangwon, Korea, Feb, 5~7, 2018 [PDF]