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2005
2. Jin-Woo Han, Hyunjin Lee, Choong-Ho Lee, Donggun Park and Yang-Kyu Choi, "Guideline for Worst Hot Carrier Stress Condition Using Substrate Current in a Body-Tied FinFET", The 12th Korean Conference on Semiconductors (KCS), pp. 99-100, Seoul, Korea, Feb. 24-25, 2005 [PDF]

1. Seong-Wan Ryu, Hyunjin Lee and Yang-Kyu Choi, "Punchthrough Characteristics of CMOS Double-Gate FinFET", The 12th Korean Conference on Semiconductors (KCS), pp. 97-98, Seoul, Korea, Feb. 24-25, 2005 [PDF]